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Description
English: Schematic infrared transmission microscopy setup for wafer bond characterization.
Source Own work
Author Fraunhofer ENAS, D. Neumann
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Attribution: Fraunhofer ENAS
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current12:00, 10 April 2011Thumbnail for version as of 12:00, 10 April 2011523 × 366 (12 KB)Enaswiki{{Information |Description ={{en|1=Schematic infrared transmission microscopy setup for wafer bond characterization.}} |Source ={{own}} |Author =Enaswiki |Date = |Permission ={{cc-by-sa-3.0-de|Fraunhofer

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